الملخص
CuS thin films were deposited onto microscope glass substrates using the chemical bath deposition method in the presence of tartaric acid as a complexing agent. The objective of this paper was to study the influence of the deposition time on the morphology of thin films. The surface morphology of the thin films was investigated using atomic force microscopy. The thin films deposited for the shortest time were found to be uniform, without cracks and with a dense surface morphology covering the entire substrate surface area. However, the films prepared for 60 min and above indicated incomplete coverage of the material over the substrate surface. The surface roughness and film thickness values that were observed depended mainly on the deposition time.
الكلمات المفتاحية
بيانات النشر
- المعرّف الرقمي
- 10.24200/squjs.vol16iss0pp24-33
- المجلة
- مجلة جامعة السلطان قابوس للعلوم, 16, 24
- الناشر
- جامعة السلطان قابوس
- وصول مفتوح
- وصول مفتوح ذهبي
- الترخيص
- CC BY 4.0
اقتبس هذه المقالة
APA 7
Kassim, A., Min, H. S., Siang, L. K., & Nagalingam, S. (2011). Surface Morphology of Cus Thin Films Observed by Atomic Force Microscopy. Sultan Qaboos University Journal for Science, 16, 24. https://doi.org/10.24200/squjs.vol16iss0pp24-33
MLA 9
Kassim, Anuar, et al. "Surface Morphology of Cus Thin Films Observed by Atomic Force Microscopy." Sultan Qaboos University Journal for Science, vol. 16, 2011, pp. 24. https://doi.org/10.24200/squjs.vol16iss0pp24-33.
شيكاغو (المؤلف–التاريخ)
Kassim, Anuar, Ho Soon Min, Lim Kian Siang, and Saravanan Nagalingam. 2011. "Surface Morphology of Cus Thin Films Observed by Atomic Force Microscopy." Sultan Qaboos University Journal for Science 16: 24. https://doi.org/10.24200/squjs.vol16iss0pp24-33.
هارفارد
Kassim, A., Min, H. S., Siang, L. K. and Nagalingam, S. (2011) 'Surface Morphology of Cus Thin Films Observed by Atomic Force Microscopy', Sultan Qaboos University Journal for Science, 16, pp. 24. doi:10.24200/squjs.vol16iss0pp24-33.
فانكوفر
Kassim A, Min HS, Siang LK, Nagalingam S. Surface Morphology of Cus Thin Films Observed by Atomic Force Microscopy. Sultan Qaboos University Journal for Science. 2011;16:24. doi:10.24200/squjs.vol16iss0pp24-33
IEEE
A. Kassim, H. S. Min, L. K. Siang, and S. Nagalingam, "Surface Morphology of Cus Thin Films Observed by Atomic Force Microscopy," Sultan Qaboos University Journal for Science, vol. 16, pp. 24, 2011, doi: 10.24200/squjs.vol16iss0pp24-33.