الملخص
As technology scales to smaller nodes, increasing current densities make electromigration (EM) one of the dominant reliability challenges in on-chip interconnects. Accurate transient stress analysis is needed to identify wires susceptible to EM degradation, but applying physics-based solvers across many interconnects remains computationally expensive. This paper proposes a physics-guided transformer framework for fast EM stress prediction in multi-segment interconnect lines. The framework converts each line into geometry- and DC-aware segment tokens and uses transformer attention to capture line-level context. A lightweight query decoder then predicts stress at selected locations and time instants. The model is trained with an objective that combines normalized supervised regression, linewise relative-$L_2$ loss, and physics-guided continuity and terminal-flux terms. Experiments on IBM power grid benchmarks show that the proposed model achieves relative-$L_2$ error below 8\% and reaches up to 2459.68$\times$ speedup compared with the matrix exponential~solver.
الكلمات المفتاحية
الموضوع
بيانات النشر
- المجلة
- غير متاح
- وصول مفتوح
- وصول مفتوح أخضر
اقتبس هذه المقالة
APA 7
Stoikos, P., Pathania, A., & Floros, G. (2026). A Physics-Guided Transformer Framework for Electromigration Analysis in Multi-Segment Interconnects. https://omanscience.com/ar/articles/a-physics-guided-transformer-framework-for-electromigration-analysis-in-multi-segment-interconnects
MLA 9
Stoikos, Pavlos, et al. "A Physics-Guided Transformer Framework for Electromigration Analysis in Multi-Segment Interconnects." https://omanscience.com/ar/articles/a-physics-guided-transformer-framework-for-electromigration-analysis-in-multi-segment-interconnects.
شيكاغو (المؤلف–التاريخ)
Stoikos, Pavlos, Anuj Pathania, and George Floros. 2026. "A Physics-Guided Transformer Framework for Electromigration Analysis in Multi-Segment Interconnects." https://omanscience.com/ar/articles/a-physics-guided-transformer-framework-for-electromigration-analysis-in-multi-segment-interconnects.
هارفارد
Stoikos, P., Pathania, A. and Floros, G. (2026) 'A Physics-Guided Transformer Framework for Electromigration Analysis in Multi-Segment Interconnects', Available at: https://omanscience.com/ar/articles/a-physics-guided-transformer-framework-for-electromigration-analysis-in-multi-segment-interconnects.
فانكوفر
Stoikos P, Pathania A, Floros G. A Physics-Guided Transformer Framework for Electromigration Analysis in Multi-Segment Interconnects. https://omanscience.com/ar/articles/a-physics-guided-transformer-framework-for-electromigration-analysis-in-multi-segment-interconnects
IEEE
P. Stoikos, A. Pathania, and G. Floros, "A Physics-Guided Transformer Framework for Electromigration Analysis in Multi-Segment Interconnects," https://omanscience.com/ar/articles/a-physics-guided-transformer-framework-for-electromigration-analysis-in-multi-segment-interconnects.